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http://hdl.handle.net/20.500.12666/343
Título : | Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor |
Autor : | Rodríguez Schwendtner, E. Álvarez Herrero, A. Mariscal, A. Serna, R. González Cano, A. Navarrete, M. C. Díaz Herrera, N. |
Fecha de publicación : | 17-oct-2019 |
Editorial : | AIP Publishing |
DOI: | 10.1116/1.5121590 |
Versión del Editor: | https://avs.scitation.org/doi/abs/10.1116/1.5121590 |
Citación : | Journal of Vacuum Science and Technology B 37(6): 062914(2019) |
Resumen : | The authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by spectroscopic ellipsometry. From the effective thicknesses determined by the ellipsometric characterization, it is shown by simulations that surface plasmon resonances (SPRs) can occur in the fiber device, and it is demonstrated experimentally. These results show the feasibility of employing bismuth as a plasmonic material in SPR fiber sensors based on doubly-deposited uniform-waist tapered optical fibers, which show excellent performance and versatility. Published by the AVS. |
URI : | http://hdl.handle.net/20.500.12666/343 |
E-ISSN : | 1520-8567 |
ISSN : | 1071-1023 |
Aparece en las colecciones: | (Espacio) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
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acceso-restringido.pdf | 221,73 kB | Adobe PDF | Visualizar/Abrir |
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