Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/20.500.12666/945
Título : A Subcell Finite-Difference Time-Domain Implementation for Narrow Slots on Conductive Panels
Autor : Ruiz Cabello Núñez, M. D.
Martín Valverde, A. J.
Plaza Gallardo, B.
Frövel, M.
Poyatos Martínez, D.
Rubio Bretones, Amelia C.
Gascón Bravo, Alberto
García, S. G.
Palabras clave : Numerical electromagnetics;Complex electromagnetic environments;Electromagnetic compatibility;Finite difference time domain (FDTD);Narrow slot;Small apertures;Subcell modeling;Subgridding;Thin gaps
Fecha de publicación : 3-ago-2023
Editorial : Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/app13158949
Versión del Editor: https://www.mdpi.com/2076-3417/13/15/8949
Citación : Applied Sciences 13(15): 8949(2023)
Resumen : Efficiently modeling thin features using the finite-difference time-domain (FDTD) method involves a considerable reduction in the spatial mesh size. However, in real-world scenarios, such reductions can lead to unaffordable memory and CPU requirements. In this manuscript, we present two stable and efficient techniques in FDTD to handle narrow apertures on conductive thin panels. One technique employs conformal methods, while the other utilizes subgridding methods. We validate their performance compared to the classical Gilbert-Holland model and present experimental results in reverberation environments to shed light on these models’ actual confidence margins in real electromagnetic compatibility (EMC) scenarios.
Descripción : (This article belongs to the Special Issue Feature Papers in 'Electrical, Electronics and Communications Engineering' Section). Ruiz Cabello, M. [0000-0001-9039-6181]; Martín Valverde, J. [0000-0003-1417-1268]; Plaza Gallardo, B. [0000-0003-3615-0353]; Frövel, M. [0000-0001-9447-4036]; Poyatos Martínez, D. [0000-0002-3829-5110] ; Rubio Bretones, A. [0000-0002-9337-9093] ; Gascón Bravo, A. [0000-0003-1190-2248] ; García García, S. [0000-0003-4494-7565].
URI : http://hdl.handle.net/20.500.12666/945
E-ISSN : 2076-3417
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