Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12666/949
Title: Uncertainty budget in microwave high-power testing
Authors: García Patrón, Martín
Rodríguez, Manuel
Ruiz-Cruz, Jorge A.
Montero, Isabel
Keywords: Measurement uncertainty;Metrology;Multipactor;Radio frequency (RF) high power testing;Space technology;Test security margin;Uncertainty bidget
Issue Date: 22-Sep-2023
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TIM.2023.3317909
Published version: https://ieeexplore.ieee.org/document/10261456
Citation: IEEE Transactions on Instrumentation and Measurement 72: 1009512(2023)
Abstract: Space-borne radio frequency (RF) systems must cope with hard qualification procedures, including the evaluation of high-power handling capability of equipment for space applications. Whatever the electrical parameter is being measured, the general rule of thumb throughout a verification process is to check whether the system can operate up to certain thresholds, which are defined to ensure total reliability for the mission along its operative lifetime. Therefore, assessing and reducing the uncertainty linked to their measurement are mandatory issues as it directly affects the accuracy of the qualification process and hence the safety of the whole space mission. This article presents a novel comprehensive study of all variables affecting measurement uncertainty for high RF power test activities. This study is focused on space applications, and, in particular, multipactor testing, because they comprise the largest number of variables. This is not a restricting case; in fact, the outcome of this work is applicable both for space and ground RF applications. As a conclusion, a complete uncertainty for RF high-power testing is obtained, and, where possible, mitigation actions have also been defined.
Description: Martin Garcia-Patron [0000-0003-4534-7449] ; Manuel Rodriguez Higuero [0009-0006-0396-0607] ; Jorge A. Ruíz-Cruz [0000-0003-3909-8263]
URI: http://hdl.handle.net/20.500.12666/949
E-ISSN: 1557-9662
ISSN: 0018-9456
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